Application note

Fast fabrication feedback for manufacturing of superconducting thin-films

We present a measurement of the critical temperature of a superconducting thin-film sample using a kiutra L-Type Rapid fast turnaround cryostat and a Zurich Instruments MFLI Lock-In Amplifier. The combination of both devices allows us to characterize the thin-film resistivity change down to millikelvin temperatures within less than 5 hours, including sample cooldown, measurement and warmup times.

Keywords: thin-film superconductors, cryogenic superconductivity measurements, nanofabrication of superconducting quantum devices, quantum materials and superconducting films characterization

Products: kiutra L-Type Rapid, Zurich Instruments MFLI