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Product release

kiutra and qprobe combine fast cryogenics with automated device probing

Fast cryogenic cycling meets automated probing for higher-throughput characterization

Gold-plated qprobe cryo-prober on a Puck 80, the qprobe logo on its side

Kiutra and qprobe announce the integration of qprobe’s cryo-prober technology into kiutra’s L-Type Rapid cryostat. The solution combines rapid cryogenic cycling with automated device probing to increase characterization throughput and maximize automation. Researchers can measure more devices per cooldown while reducing the testing overhead that slows conventional workflows, including sample preparation, wire bonding, and repeated cryogenic cycles.

Two bottlenecks

Cryogenic device characterization throughput is limited by two factors: how many devices can be measured during each cooldown and how long each cryogenic cycle takes. Conventional workflows often test only a few devices per cooldown, requiring repeated sample preparation and cryogenic cycling to build statistically meaningful datasets. Kiutra and qprobe address both bottlenecks: kiutra shortens cryostat turnaround time, while qprobe’s cryo-prober increases the number of devices that can be measured during each cooldown. Together, the technologies enable faster and more scalable cryogenic characterization.

Device physics needs statistics, but cryogenic measurement has never been able to supply them at a reasonable pace. Every device you wanted to compare meant another bonding job and another cooldown. Automating both the loading and the probing means our customers can test hypotheses on real devices instead of settling for simulation.
Klaus Eibensteiner, Research & Innovation Lead L-Type Rapid, kiutra

From days to hours

The integrated solution combines kiutra’s L-Type Rapid cryostat with qprobe’s cryo-prober. The prober is loaded fully automatically using the L-Type Rapid’s sample-loading system. Once at operating temperature, it automatically positions the probes across different devices within a 20 × 20 mm² probing area, enabling 10x to 100x more devices to be electrically characterized during a single cooldown without repeated sample preparation or separate cryostat cycles. This effectively moves characterization times from days to hours and eliminates the laborious task of bonding dozens of samples.

Gold-plated qprobe cryo-prober on a Puck 80 next to the black kiutra Transfer Cage, qprobe edition
qprobe and kiutra Transfer Cage

Less manual intervention

Kiutra provides rapid cryogenic turnaround and automated sample loading, while qprobe adds optical probe alignment and automated device probing. Together, the technologies reduce manual intervention and increase the number of devices that can be characterized during each cooldown, enabling higher-throughput automated cryogenic device characterization.

Kiutra has already removed much of the waiting and manual handling between cryogenic measurement runs. By adding qprobe’s automated multi-device probing, we can make much better use of each cooldown—measuring many devices without repeated sample exchange and turning fast cryogenics into true high-throughput characterization.
Andreas Kuhlmann, Co-Founder, qprobe

Key specifications

20 × 20 mm²

Probing area

48

DC lines

~3 K

Operating temperature

~2.5 h

Cooldown time

Features

  • Optical access
  • Fully automated prober loading
  • Fully automated device probing
  • L-Type Rapid with full compatibility to Puck 80 and further measurement options

Now generally available

The cryo-prober with Puck 80 was first presented at the APS Global Physics Summit and is now generally available. More information about qprobe’s cryo-prober is available at: qprobe.ch/products/1-k-prober. More information about kiutra’s L-Type Rapid is available at: kiutra.com/products/l-type-rapid-cryostat.

About kiutra

Since 2018, kiutra has been committed to accelerating quantum breakthroughs and scientific research through fast and easy access to kelvin and millikelvin temperatures. Our cryostats and services are advancing tomorrow’s quantum technologies through scalable systems that offer the fastest available cooldown times, simplified sample loading processes, and an eliminated dependency on scarce helium-3.

About qprobe

qprobe develops automated cryogenic probing systems for high-throughput device characterization from 4 K down to millikelvin temperatures. Its technology enables 100s of devices to be contacted and measured during a single cooldown, increasing measurement throughput and accelerating cryogenic R&D. More information: www.qprobe.ch

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